Effect of an electric field within microscopy focused ion beam (FIB) between manipulator sharp and the ion trap of the electron detector

Gomez Jorge A.; Perez Hernandez; A. Duarte-Moller; A.

doi:10.5897/IJPS11.352

International Journal of
Physical Sciences

Abbreviation: Int. J. Phys. Sci.
Language: English
ISSN: 1992-1950
DOI: 10.5897/IJPS
Start Year: 2006
Published Articles: 2572

Full Length Research Paper

Effect of an electric field within microscopy focused ion beam (FIB) between manipulator sharp and the ion trap of the electron detector

Gómez Jorge A.1, Pérez Hernández2 and A. Duarte-Moller, A.2*

1Instituto Potosino de Investigación Científica y Tecnológica, Camino a la Presa San José 2055. Col. Lomas 4 sección CP. 78216, México. 2Centro de Investigación en Materiales Avanzados Chihuahua, Miguel de Cervantes Saavedra No. 120, Complejo Industrial Chihuahua, Chihuahua, Chih., México
Email: [email protected].

Article Number - 83A116619361
Vol.6(22), pp. 5104-5108 , October 2011
https://doi.org/10.5897/IJPS11.352

Accepted: 15 July 2011
Published: 02 October 2011

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